In the present work, electrical structural and surface morphology of tin oxide thin
films prepared using simple conventional method known as (CTO) was carried out. The
obtained result insures the formation of Nano crystalline SnO2 films as a tetragonal
structure. The atomic force microscope results show that film roughness depended on
oxidation temperature. Minimum electrical resistivity found to be about (5.35 x 10-5
W.cm) at (300°C) oxidation temperature.
Keywords: Tin Oxide; Electrical Properties and Measurements, Structural Properties
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